Various fixes and improvements (#515)

* Optional internal pull-ups for SD/MMC pins in DTS
  * Selectable on‑chip LDO channel for SD/MMC power (can be disabled)
  * Added several sensor/driver modules to generic ESP32 device configurations so that they become part of the SDKs
  * SD card mount now prints card information for clearer diagnostics
  * Fix for bug DTS boolean parsing. Improved tests to catch these issues.
  * Expanded SDK integration test to include new modules and headers
  * Modularized packaging to generate per‑module build files and include driver assets

Buildscripts/DevicetreeCompiler/tests/data/bindings/test,bool-device.yaml

@@ -0,0 +1,16 @@
+description: Boolean test device binding
+compatible: "test,bool-device"
+properties:
+  binding-default-true-setting-implied:
+    type: boolean
+    default: true
+  binding-default-false-setting-implied:
+    type: boolean
+    default: false
+  binding-default-false-setting-direct:
+    type: boolean
+    default: false
+  binding-implied-true-setting-direct:
+    type: boolean
+  binding-implied-true-setting-implied:
+    type: boolean

Buildscripts/DevicetreeCompiler/tests/data/bindings/test,generic-device.yaml

@@ -1,11 +1,9 @@
-description: Test device binding
-compatible: "test,device"
+description: Generic test device binding
+compatible: "test,generic-device"
 properties:
   reg:
     type: int
     required: true
-  boolean-prop:
-    type: boolean
   int-prop:
     type: int
   string-prop: